Hardware Options

Add New Resources For More Test Capabilities
Do you need to test more complex devices? Here is where you can add those capabilities without breaking your budget.
More Digital Pins: DPM, Digital Pattern Memory, Pins, Higher Speed Multi-Site Custom Test Solutions: PTH, All the right choices to solve unique testing challenges
  • Open Source Hardware. Create your own test resource at the DUT.
  • High Current Switching: 9A relay board
  • Remote Relay Matrix: Get close to the DUT, customize signal switching
  • Quad Ramp and Hold
  • Op Amp Loop
  • Digitizer Front End
  • Waveform Generator Back-End (WGBE): Waveform Generation where you need it
Expand Your Tester Capabilities Now. On Time-On Budget, ROI.   

Digital (up to 512 Channels)

Today’s high speed, high pin count devices need the capabilities offered by the new ATS digital option. Make the smart choice and upgrade to the new ATS digital option with 120MHz pattern rate by 16Meg deep.    

Multi-Site

Significant test throughput improvements are achievable by implementing multi-site test strategies. All ATS Test Systems have multi-site capabilities (up to 8 sites) that will work with any Handler or Prober. GPIB, RS232, and parallel interfaces are included with every tester.    

Programmable Test Head (PTH)

All the right choices to solve unique testing challenges.
The Programmable Test Head (PTH) offers a large selection of stimulus and measurement options that significantly reduce the complexity of Test Fixture design.    
  • Open Source Hardware. Create your own test resource at the DUT.
  • High Current Switching: 9A relay board
  • Remote Relay Matrix: Get close to the DUT, customize signal switching with 48 relays
  • Quad Ramp and Hold (QRH)
  • Dual Op Amp Loop
  • Digitizing Voltmeter Front End (DVFE)
  • Waveform Generator Back-End (WGBE): Waveform Generation where you need it
  • Time Measurement Unit Front End (TMUFE)
  • Quad Picoammeter (PA)
  • Quad Differential Pulse Driver (PD)
  • Video Front End (VFE)