Semiconductor Technologies
Analog
Linear test resources can be mixed and matched in any combination for the just the right
analog test solution. DUT power supplies, arbitrary waveform generator, precision current
and measure are just a few of the resources.
The basic linear hardware in the STS3500™ and STS5000™ series Test Systems includes a suite
of test instruments that provide the capability to test analog devices of all types; and
other hardware that gives the system its functionality. The system comes standard with
precision V/I sources, and can be configured with a full range of medium and high power
sources. In addition to the standard V/I sources are bias supply sources, an AC source,
modulation source, and arbitrary waveform generator. Measurement instruments include a
16-bit digitizing voltmeter, AC voltmeter, system calibrator, and time measurement unit.
Control instruments include the Relay Drivers, the Kelvin switching Matrix, and GPIB controller.
Digital
Today’s digital devices require more pins, greater accuracy, faster data rates and larger
patterns. To meet this challenge we’ve developed a significant enhancement to the STS
addressing all four of these criteria.
Our new digital option can be installed in your 3500, 4000, or 5000. Pattern rate is
120 megahertz, depth is 16 meg and width is up to 512 pins (96 pins on the 3500).
Digital pin channels are in increments of 16. Each increment includes independent IO
serial pattern memory of 128 meg for SCAN or BIST.
ATS Test Systems provide precision digital signals to the digital pins of a device under
test (DUT). This capability enables high-speed testing of digital and mixed-signal devices.
Test applications include devices with microprocessor interfaces, clock and data lines on
A/D and D/A converters, codecs, modems, and other mixed-signal devices.
Mixed Signal
MST (Mixed Signal Test) addresses the combination of digital and analog technologies within the
same device package.
STS3500™ and STS5000™ series Test Systems perform high-speed precision tests on mixed-signal
semiconductor devices. Test applications include A/D and D/A converters, data acquisition
subsystems, application specific integrated circuits (ASICs), and telecommunications devices
such as CODECs, MODEMs, and ISDN interfaces. The internal expansion rack permits a wide range
of power supplies and GPIB devices to be installed. Digital signal processing (DSP) capabilities
are also available.
Automotive
Automotive electronics has grown prolifically in the past decade. It will continue to be an
industry segment that experiences high growth in power devices, communications busses, and
smart controllers. CAN, FlexRay and LIN busses interconnect smart ICs thereby reducing the
size of wire harnesses, improving efficiency and increasing functionality.
System hardware is designed to ensure applications flexibility, system expandability, and
maintainability. Synchronized source and measurement functions enhance system performance,
especially in automotive test applications. Devices include: CAN interface transceivers,
ultrasonic distance sensors, air bag deployment devices, Hall effect sensor interfaces,
and many others.
High Power
High Power, Unipolar High Power, and High Voltage VI supplies are available for ATS Test Systems,
with programmable capabilities of up to 1000 volts or up to 100 amps. A High Power or High Voltage
switching matrix is also available.
Wafer and Packaged
ATS Test Systems have built in hardware and software designed for testing Wafers or packaged devices.
GPIB, RS232, and parallel interfaces make it easy to interface to any Prober or Handler.